还观察到层错象中的位错。
Dislocations within the stacking fault image were also observed.
本文利用保角变换方法计算了近椭圆孔边位错象力。
The image force on the dislocation near an elliptical hole is calculated by conformal mapping technique.
在实验上采用反射偏光法抵消旋光后沿光轴观察获得了位错双折射象，并和计算结果进行了比较。
Using reflection polarizing microscopy to compensate the natural optical activity, along the optical axis, we obtained the images of edge dislocations and compared it with the calculation.
实验结果表明，位错类型和颗粒边界图象清晰，又便于观察。
Experimental results indicate that dislocation patterns and grain boundaries are a clear bright image and easily observable.
实验结果表明，位错类型和颗粒边界图象清晰，又便于观察。
Experimental results indicate that dislocation patterns and grain boundaries are a clear bright image and easily observable.
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