所述读出放大器基于所述启用信号检测用于所述列存储器单元的位线。
The sense amplifiers detect bit lines for the columns of memory cells based on the enable signals.
本发明提供一种用于读取存储器单元的状态的读出放大器电路。
A sense amplifier circuit for reading the state of memory cells.
本发明提供一种用于读取存储器单元的状态的读出放大器电路。
A sense amplifier circuit for reading the state of memory cells.
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