测试表明，优化后的电路在读写距离、电路尺寸、抗干扰性等方面都优于原样机。
Testing results show that the optimized circuit is superior to the original prototype in reading, writing distance, circuit size, and interference.
测试表明，优化后的电路在读写距离、电路尺寸、抗干扰性等方面都优于原样机。
Testing results show that the optimized circuit is superior to the original prototype in reading, writing distance, circuit size, and interference.
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