本文以usb逻辑分析仪作为一种典型的被测对象，进行了可测性设计的再开发工作，使其具有支持IEEE 1149.1边界扫描功能的设备结构。
This paper chooses USB logic analyzer as a typical tested object, and carries through a second develop to design it supporting IEEE 1149.1 boundary-scan function for testability.
本文以usb逻辑分析仪作为一种典型的被测对象，进行了可测性设计的再开发工作，使其具有支持IEEE 1149.1边界扫描功能的设备结构。
This paper chooses USB logic analyzer as a typical tested object, and carries through a second develop to design it supporting IEEE 1149.1 boundary-scan function for testability.
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