记录测量设备上那个同时连接到被测器件和第一个模拟输入通道的输出通道。
Note that the analog output is connected to both the DUT input and to the first analog input channel on the measurement device.
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。
Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通常，测试接点电阻的目的是确定接触点氧化或其它表面薄膜积累是否增加了被测器件的电阻。
Often, the purpose of the contact resistance test is to determine whether contact oxidation or other surface film buildup has increased the resistance of the device under test.
用红外热成像系统直接获得的热像图，是被测器件表面辐射温度的分布，并不是真实温度的分布。
The thermograph obtained by a thermal imaging system is only the distribution of radiant temperature of the surface of measured devices, not the true temperature.
如果你的被测器件对于这个激励信号有明显的过渡反应，选择适当的时间间隔使这个过渡反应忽略。
If your DUT has a significant transient response to the start of a stimulus signal, select the appropriate settle time to allow this transient response to pass.
与电压测量不同，电荷测量可能是破坏性测量，换言之，进行测量的过程可能会消除被测器件中储存的电荷。
Unlike a voltage measurement, a charge measurement can be a destructive measurement. In other words, the process of making the measurement may remove the charge stored in the device under test.
每位被测妇女都观看一个光学器件，其快速连续的显示三个小圆盘。
Each woman looks into an optical device that shows her three tiny discs in rapid succession.
当被测dut发生短路或其他异常导致电流或电压过高时，钳位电路会将输出电压或电流限制在一个固定值上，以保护器件不被损坏。
Meanwhile, the clamp circuit will limit the output voltage or current at a fixed value when they are abnormal that caused by a DUT short circuit or other fault in order to protect the device.
直测式是将霍尔器件置于具有线圈绕组或直穿母线的环型铁磁体气隙中，测出气隙里的磁压降，即为被测电流。
The direct measure mode is that Hall part is set into the interspace of loop winding or magnet coil, then the magnetism voltage difference or the current is measured.
直测式是将霍尔器件置于具有线圈绕组或直穿母线的环型铁磁体气隙中，测出气隙里的磁压降，即为被测电流。
The direct measure mode is that Hall part is set into the interspace of loop winding or magnet coil, then the magnetism voltage difference or the current is measured.
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