XFS分析表明含铁量基本不变，证明上述变化仅发生在很薄的表面层。
XFS analysis demonstrated that the content of iron remained unchanged which proved that the above mentioned change occurred only on a very thin surface layer.
利用缺陷反应和扩散原理对表面层效应进行了初步分析，指出表面层效应的研究对改善和调节材料的电学性能具有重要的指导意义。
The analysis of surface effect is based on defect reaction and diffusion theory, the study for surface effect will have good guidance to the improvement of electrical properties.
本文讨论了样品表面层有微观应变梯度时X射线衍射线形分析的方法。
This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer.
利用扫描电镜（SEM）、透射电镜（TEM）和X射线衍射（XRD）等技术分析研究了表面层的微观结构特征。
The substructure morphology and characteristics of the treated region was examined by SEM, TEM and XRD technique.
由于模具表面层与基体材料的机械性能有明显的差异，忽略表面层进行的模具强度分析将产生不可忽视的误差。
Because of the obvious difference of the mechanical properties between the surface layer and its base, the strength analysis with neglecting surface layer will result in error not to be ignored.
进而分析了近表面层厚度的变化及不同的弹性常数分布对超声波模式和速度的影响。
The different wave modes have been distinguished and the phase velocities of these modes have been obtained.
进而分析了近表面层厚度的变化及不同的弹性常数分布对超声波模式和速度的影响。
The different wave modes have been distinguished and the phase velocities of these modes have been obtained.
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