实验中对硅烷膜用X-射线光电子能谱（XPS）、现场表面增强拉曼散射光谱（SERS）和原子力显微镜（AFM）进行了表征。
The silane films were characterized by Xray photoelectron spectroscopy (XPS), insitu Surfaceenhanced Raman spectroscopy (SERS), atom force microscopy (AFM).
实验中对硅烷膜用X-射线光电子能谱（XPS）、现场表面增强拉曼散射光谱（SERS）和原子力显微镜（AFM）进行了表征。
The silane films were characterized by Xray photoelectron spectroscopy (XPS), insitu Surfaceenhanced Raman spectroscopy (SERS), atom force microscopy (AFM).
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