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  • 利用透射电子显微术(TEM)研究了这些薄膜退火前后的结构。

    Both structural properties of as deposited and annealed multilayers have been studied with transmission electron microscopy (TEM).

    youdao

  • 利用透射电子显微术(TEM)研究了这些薄膜退火前后的结构。

    Both structural properties of as deposited and annealed multilayers have been studied with transmission electron microscopy (TEM).

    youdao

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