介绍了在外壳检验中，应用X射线荧光光谱法（XRF），对外壳的镀涂层厚度进行测试；
Measurement of coating thickness in the proof-test of IC packages and metal cases using X-Ray Fluorescence (XRF) spectrometry is described.
介绍了在外壳检验中，应用X射线荧光光谱法（XRF），对外壳的镀涂层厚度进行测试；
Measurement of coating thickness in the proof-test of IC packages and metal cases using X-Ray Fluorescence (XRF) spectrometry is described.
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