针对TSAT专用集成电路(ASIC)的测试，充分展示了微芯片在航空飞行中的功能、速度和匹配性。
Tests of the TSAT Application Specific Integrated Circuit (ASIC) demonstrated the microchip \ 's functionality, speed and suitability for spaceflight.
各种类型的嵌入式存储器大量集成于数字芯片中，由于芯片端口的限制，直接测试这些存储器非常困难。
A large number of various embedded memory are integrated in digital chips, as the constraints of chip ports, direct test of these memories is very difficult.
随着集成电路设计进入超深亚微米阶段，电路复杂度不断提高，芯片测试面临着巨大的挑战。
As the integrated circuit design has stepped into the deep ultra-submicron stage, the complexity of the circuit increases continually, chip test faces very huge challenge.
利用微机械体硅工艺及键合技术，把系统中的测试机构、加载机构以及力传感器集成在一个单一的芯片上。
The loading structure, testing part and force sensors were all integrated on a single chip by bulk silicon technology and bonding process.
研究了基于集成心跳探测芯片的心跳测试仪，介绍了其组成部分，即反射式红外传感器，单片机和LED显示器。
Studies heart rate testers based on integration heartbeat detection chip and introduces other components of the testers such as reflective infrared sensor, single-chip and LED display.
随着芯片集成度和印刷电路板复杂度的不断提高，边界扫描测试技术在芯片故障检测中的应用越来越广泛。
With the continual improvement of the chip's integration level and complexity of print circuit board, the application of boundary scan test technology becomes wider and wider in testing ICs.
介绍了利用8098单片机和其它接口芯片，实现对数字集成电路进行测试诊断的原理和方法。
This paper introduces the principles and methods of the test and diagnosis of digital IC, using 8098 Single chip Computer and other interface Chips.
成功地将共面线应用在深亚微米高速集成电路的设计中，并给出了放大器芯片和共面线的测试结果。
Finally, the coplanar stripline on-chip is successfully used in the design of the high-speed IC's, and some measured results are also given.
VLSI集成电路芯片测试技术正在向高层次测试推进。
The VLSI testing is being pushed to the high-level based technology.
测试芯片上的“系统”很多人已写了一个“片面系统”的概念，逻辑和模拟功能不断增长的集成在一个硅芯片或芯片。
Testing the "system on a chip" Much has been written about the concept of a "system on a chip," the ever-increasing integration of logic and analog functions on one silicon die or chip.
本论文的主要任务就是以通用的调频通信集成电路芯片为平台设计出一个用于语音通信的低成本无线收发模块，最后还要完成电路参数指标的自动测试。
The mission of this project is to design a low-cost wireless transceiver be used voice communication base on the general chip, and finally complete the automatic test for this.
针对TSAT专用集成电路（ASIC）的测试，充分展示了微芯片在航空飞行中的功能、速度和匹配性。
Tests of the TSAT Application Specific Integrated Circuit (ASIC) demonstrated the microchip's functionality, speed and suitability for spaceflight.
我们使用了真有效值转换集成芯片AD536研制成功PTCR残余电流测试仪，本文叙述了该仪器的原理。
We used a monlithic Integrated circuit AD536 which performs ture rms-to-dc conversion. This paper describes the principle of the PTCR remainder current instrument with AD536.
而对于数模混合芯片等的测试验证，很大一部分工作还是要依赖于昂贵的仪器来完成，或使用大量的集成电路工程师来进行相关模拟芯片的可测性设计，这样既增加了成本和难度。
A large part of the test and validation for digital-analog hybrid chips is to rely on expensive equipment to carry out or design for test through a large number of IC engineers associated to analog.
直流参数测试是集成电路测试技术的重要组成部分，能够快速有效的检测芯片的性能，受到集成电路测试行业的高度重视。
DC parametric testing is an important component of IC test, it has got more attention from IC test industry, because it could detect the performance of the IC quickly and efficiently.
介绍了采用AT 89 C5 2单片机设计的集成芯片测试仪的工作原理及硬软件设计。
It introduces the operation principle and hardware and software design of a IC chip test instrument based on AT89C52 chip microcomputer.
介绍了采用AT 89 C5 2单片机设计的集成芯片测试仪的工作原理及硬软件设计。
It introduces the operation principle and hardware and software design of a IC chip test instrument based on AT89C52 chip microcomputer.
应用推荐