• 芯片规模指数上升要求面市时间快速缩短双重压力验证成为数字集成电路设计瓶颈

    Under pressure of the increase of chip scale and the decrease of timing to market, verification has become the bottleneck of digital IC design.

    youdao

  • 芯片规模指数上升要求面市时间快速缩短双重压力验证成为数字集成电路设计瓶颈

    Under pressure of the increase of chip scale and the decrease of timing to market, verification has become the bottleneck of digital IC design.

    youdao

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