通过对引入紫外胶前后探测器量子效率的测试与对比,论证了紫外胶在半导体探测器制作工艺中的可用性。
The quantum efficiencies of PIN photo-detector before and after using UV glue are tested respectively, and the light transmission characteristic is still tested.
通过对引入紫外胶前后探测器量子效率的测试与对比,论证了紫外胶在半导体探测器制作工艺中的可用性。
The quantum efficiencies of PIN photo-detector before and after using UV glue are tested respectively, and the light transmission characteristic is still tested.
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