对X射线粉末衍射进行了指标化。
射线粉末衍射仪表征了它们的结构特征。
Their crystalline structures were characterized by X ray powder diffraction.
所有固相反应产物经元素分析和X射线粉末衍射法表征。
Elemental analysis and XRD are used to characterize the solid products.
首次报导X射线粉末衍射法测量铁粉晶胞的磁致伸缩系数。
In situ magnetization X-ray powder diffraction method is firstly applied to measure magnetostriction coefficient of reduction iron powder.
射线粉末衍射分析表明所制得的杂化材料基本上是非晶态物质。
XRD analysis indicated that the prepared hybrid material was amorphous material.
另外，对化合物1的荧光、热重、粉末衍射等也进行了研究和讨论。
Additionally, fluorescent properties, TG analysis, and PXRD for complex 1 were also measured and discussed.
射线粉末衍射数据确证了其晶体结构，证明这些荧光粉晶相组成纯净。
The data of X-Ray Powder Diffraction have proved these phosphors 'structure and their pure crystal composition.
通过红外光谱和X -射线粉末衍射对复合变性淀粉进行了结构表征。
The structural characterization of the composite modified starch was determined with IR and X-ray diffraction.
通过X -射线粉末衍射证明了溶析结晶与冷却结晶得到的晶体结构相同。
X-ray powder diffraction showed that crystals prepared by cooling and dilution crystallization were of the same structure.
本文根据文献的有关资料，综述了粉末衍射图形拟合修正晶体结构的方法。
The refinement of crystal structure by the powder diffraction profile fitting method is reviewed on the basis of the relevant in the literature.
讨论了多相物质粉末衍射的物相检索问题，介绍了XRDS的物相检索软件。
The problems of phase identifying for powder diffraction of multiphase material have been discussed, and the software XRDS for phase identifying have been introduced.
通过X射线粉末衍射（XRD）和扫描电子显微镜（SEM）对产物进行了表征。
The prepared product has been characterized by means of X-ray diffraction (XRD) and scanning electron micrography (SEM).
射线粉末衍射（XRD）分析表明，复合掺杂没有改变晶体的六方单相层状结构。
The results of X-ray diffraction (XRD) analysis show that it remains a well-layered structure with single phase of hexagonal after composite doping.
本文还给出了一套完整的晶体X射线粉末衍射数据，补充了jcpds卡片的不足。
A complete set of data on X-ray powder diffraction of KTPcrystals was obtained, which was a supplement to JCPDS CARDS.
本文采用原子力显微镜和X射线粉末衍射仪研究了PVA溶液旋转涂膜的溶剂化效应。
The solvent effect on the preparation of PVA film by low speed spin machine was studied by using AFM and XRD.
本系统介绍了用微型计算机进行运行控制和信息采集及处理的三探头中子粉末衍射仪系统。
This paper introduces a neutron diffractometer system with three detectors in which the microcomputer is applied to control Instruments, collect information and process data.
射线粉末衍射物相分析的结果又进一步证实了化合物（A）和（B）是两种完全不同的物相。
The results of X ray diffraction analyses further proved that compounds (A) and (B) are of two different phases.
并采用IR光谱，X-射线粉末衍射测试手段对其进行分析，并对产物的热稳定性进行了研究。
They were characterized by FT-IR and XRD. In addition, We have studied their thermal stability.
经元素分析、X -射线粉末衍射、中红外、远红外光谱进行表征，确定了配合物的组成和结构。
Its chemical composition and structure are characterized by the chemical analysis, elemental analysis, IR patterns and X-ray powder diffraction.
并利用TG、DTA、IR光谱和x射线粉末衍射等手段研究了两系列稀土杂多配合物的热稳定性；
The thermal stability of these two series complexes was studied by TG, DTA, IR spectra and X-ray powder diffraction.
根据实验所得的产物其x -射线粉末衍射曲线呈馒头峰是非晶态，没有出现模板甘氨酸铜的衍射峰。
According to the experimental product derived from its X-ray powder diffraction peak curve bread is amorphous, glycine template no diffraction peak of copper.
并用扫描电镜（SEM）和X射线粉末衍射（XRD）方法对其微观形貌和物相结构进行了观察和检测。
The micro-morphologies and phase structures of the samples are observed by scanning electron microscope (SEM) and X-ray diffraction (XRD).
对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。
They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).
运用X -射线粉末衍射(XRD)、透射电镜(TEM)等技术对碱式碳酸铜热重分解产物进行了表征。
The thermal decomposition products were characterized by the powder X-ray diffraction (XRD) and transmission electron microscopy (TEM).
通过化学分析、元素分析、IR光谱、TG - DTG及X射线粉末衍射分析等对其进行了物理化学表征。
It was characterized by IR spectra, TG-DTG, X-ray powder diffraction, as well as chemical and elemental analyses.
产物经x -射线粉末衍射(XRD)、透射电子显微镜(TEM)和高分辨电子显微镜(HRTEM)表征。
They were characterized by X-ray powder diffraction (XRD), transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM).
通过X射线粉末衍射仪、场发射扫描电子显微镜和荧光分光光度计分别表征样品的晶体结构、颗粒形貌和发光性能。
The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.
通过X射线粉末衍射（XRD）、扫描电镜（SEM）、透射电镜（TEM）以及荧光光谱对获得的试样进行了表征。
X-ray powder diffraction(XRD), scanning electron microscopy(SEM), transmission electron microscopy(TEM) and photoluminescence spectra were used to characterize the resulted BAM phosphor.
通过X射线粉末衍射（XRD）、扫描电镜（SEM）、透射电镜（TEM）以及荧光光谱对获得的试样进行了表征。
X-ray powder diffraction(XRD), scanning electron microscopy(SEM), transmission electron microscopy(TEM) and photoluminescence spectra were used to characterize the resulted BAM phosphor.
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