荧光信号检测系统，采用硅光敏三极管作为荧光信号探测器，8031单片机来测量荧光寿命。
The system of fluorescence measurement uses the silicon photosensitive three-electrode tube as the detection of fluorescence signal. The 8031singlechip is used to measure fluorescence lifetime.
利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。
This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.
利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。
This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.
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