利用该装置测量了一氧化碳分子的光电离效率曲线及其离子碎片的部分光学振子强度密度。
The photoionization efficiency curve and the partial optical oscillator strength densities for different fragments of CO was determined by this work.
通过质谱测量各离子的光电离效率曲线，得到了该分子的垂直电离能及主要碎片离子的出现势。
04ev and appearance potentials of various fragment ions have been determined by measuring their photoionization efficiency curves.
通过质谱测量各离子的光电离效率曲线，得到了该分子的垂直电离能及主要碎片离子的出现势。
04ev and appearance potentials of various fragment ions have been determined by measuring their photoionization efficiency curves.
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