利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。
This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.
为保证可靠和长寿命，采用了红外发光二极管（LED），光敏器件采用大功率光电池（PIN）。
To guarantee reliability and long service life, infrared LED and high power photocell (PIN) are adopted.
为保证可靠和长寿命，采用了红外发光二极管（LED），光敏器件采用大功率光电池（PIN）。
To guarantee reliability and long service life, infrared LED and high power photocell (PIN) are adopted.
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