本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
本文就纳米尺度铁电畴的扫描力显微镜的成像原理的研究进展作一综述。
This review is involved with the latest progress in the imaging principle of nanoscale ferroelectric domain via SFM.
结果表明：利用扫描电子声显微镜技术在不对样品表面进行任何处理的情况下，可以直接对电畴结构进行观察。
The results show that the SEAM technique can be used directly to observe the domain structure of ferroelectric ceramics and single crystal materials without any treatment for test samples.
结果表明：利用扫描电子声显微镜技术在不对样品表面进行任何处理的情况下，可以直接对电畴结构进行观察。
The results show that the SEAM technique can be used directly to observe the domain structure of ferroelectric ceramics and single crystal materials without any treatment for test samples.
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