当开关组件是由薄膜晶体管所构成时，测试装置更包括至少一开关配线，电性耦接至薄膜晶体管的闸极。
When these switch components are composed of a thin film transistor, the testing device at least includes a switch wiring coupled to the gates of the thin film transistor.
当开关组件是由薄膜晶体管所构成时，测试装置更包括至少一开关配线，电性耦接至薄膜晶体管的闸极。
When these switch components are composed of a thin film transistor, the testing device at least includes a switch wiring coupled to the gates of the thin film transistor.
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