本发明涉及低维纳米材料显微结构与电学性能的测试装置和方法。
The invention relates to a low-dimensional nano material microstructure and a device and a method for electrical performance testing.
本发明涉及一种纳米线的显微结构与电学性能测试装置。
The invention relates to a microstructure of a nano wire and an electrical performance testing device.
建立了高精度单电子器件测试系统。系统具有良好的温度控制、精确的电学特性测量和可加高强度磁场等性能。
The high precision single electron devices testing system with precision temperature controller, electronic characteristic testing and high magnetic field has been established.
研制的天线罩较好地通过了力学、电学性能测试和无损检测。
The radome made of the selected material system successfully passed the mechanical and electrical test.
测试及分析了HDPE 混合体系的电学性能和拉伸性能。
The electrical and mechanical properties of HDPE blends were measured and analysed.
本论文工作主要包括有机电致发光器件的制作及其一系列电学、光学性能的测试和分析。
This thesis mainly discussed the OLED's fabrication and a series of characteristics on electronic and optical property.
同时测试了有机层膜的电阻率参数，研究了有机层能级结构和分布等这些物理量与器件的电学性能和光学性能间的关系。
By measuring the resistance ratio, level construction and distribution of the organic film, explain the electronic and optical property of the device.
同时测试了有机层膜的电阻率参数，研究了有机层能级结构和分布等这些物理量与器件的电学性能和光学性能间的关系。
By measuring the resistance ratio, level construction and distribution of the organic film, explain the electronic and optical property of the device.
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