建立了一种用于解释正电子寿命谱测量结果的模型，该模型中费米能级位置的改变可影响缺陷的电离以及正电子在缺陷位置的被捕获。
The average positron lifetimes was explained by a proposed model, in which the shifting of Fermi-level affects the defect ionization and consequent positron trapping at defects site.
建立了一种用于解释正电子寿命谱测量结果的模型，该模型中费米能级位置的改变可影响缺陷的电离以及正电子在缺陷位置的被捕获。
The average positron lifetimes was explained by a proposed model, in which the shifting of Fermi-level affects the defect ionization and consequent positron trapping at defects site.
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