本文应用双视场电子散斑干涉技术，实现了对被测对象表面的全场变形和局部微观场变形的同时实时检测。
The double-field-of-view ESPI system has been presented in this paper and employed to measure the macro-scale and micro-scale deformations of the tested object simultaneously.
本文应用双视场电子散斑干涉技术，实现了对被测对象表面的全场变形和局部微观场变形的同时实时检测。
Techniques of dual receiving area detection and correlation detection were applied and realized in the improved circuit to alleviate or eliminate the interference.
去除噪声是电子散斑干涉测量技术的研究热点之一。
Noise reduction is one of the most exciting problems in electronic speckle pattern interferometry.
电子散斑干涉是一种利用全电子记录和计算机图象处理系统替代传统照相干版进行测量的先进技术。
Electronical Speckle Pattern Interferometry (ESPI) is an advance technology with all electronic image record, reconstruction and computer-aided image process.
电子散斑干涉测量技术是光学测量技术的一个重要分支。
Electronic speckle pattern interferometry(ESPI) is an important branch of optical measurement techniques.
电子散斑干涉测量技术通过在被测物体表面产生干涉条纹(载频调制条纹)，分析位移场与物面高度之间的关系，可测量物面的形貌。
ESPI can measure the object, through forming a carrier pattern on the object surface (carrier pattern modulation), analyze the relation between displacement field and altitude of the object surface.
由于电子散斑干涉测量技术具有实时显示、灵敏度高、全场测量等优点，该技术在工业无损检测中得到广泛的应用。
Owing to the prominent advantages, such as real-time display, high sensitivity and whole-field measure, ESPI is widely used in industrial nondestructive detection.
理论和实验结果对比表明，利用电子散斑干涉术技术能够精确地测量含缺陷材料表面的离面位移。
Off-plane displacement field on defects can be accurately measured by ESPI. It is fully proved by comparison between experimental results and theoretical results.
结果表明该技术能够显著改善条纹图的质量，是一种行之有效的电子散斑干涉条纹图的预处理方法。
The results show that this technique is capable of significantly improving the quality of fringe patterns. It works well as a pre-processing for the fringe patterns by ESPI.
原始的电子散斑干涉条纹图中含有很强的颗粒性噪声，对比度很差，因此去除噪声是电子散斑干涉测量技术的关键问题。
Traditional speckle fringe patterns by electronic speckle pattern interferometry (ESPI) are inherently noisy and of limited visibility, so denoising is the key problem in ESPI.
系统介绍了电子散斑干涉的原理及散斑干涉中的位相测量技术。
Electronic speckle pattern interferometry principle and phase measurement technology in the speckle interferes is introduced2.
系统介绍了电子散斑干涉的原理及散斑干涉中的位相测量技术。
Electronic speckle pattern interferometry principle and phase measurement technology in the speckle interferes is introduced2.
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