在现有的商用原子力显微镜上实现了用动态电场力显微术来研究单个纳米颗粒的极化特性。
Dynamic electric force microscopy was set up on a commercial atomic force microscope (AFM) to study the polarization of single nanocrystal.
在现有的商用原子力显微镜上实现了用动态电场力显微术来研究单个纳米颗粒的极化特性。
Dynamic electric force microscopy was set up on a commercial atomic force microscope (AFM) to study the polarization of single nanocrystal.
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