这减少了设备的厚度和电压损耗，从而降低材料的质量要求和探测器的材料成本。
This decreases the device thickness and depletion voltage and consequently reduces material quality requirements and cost of the detector material.
这减少了设备的厚度和电压损耗，从而降低材料的质量要求和探测器的材料成本。
This decreases the device thickness and depletion voltage and consequently reduces material quality requirements and cost of the detector material.
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