本文报导了MOS结构在准静态测试中的异常电容-电压曲线。讨论了它们产生的原因。
The anomalous curves of MOS structures in quasi-static capacitance-, oltagc measurements are reported in this paper, and reasons for the generation of these curves are discussed.
本文报导了MOS结构在准静态测试中的异常电容-电压曲线。讨论了它们产生的原因。
The anomalous curves of MOS structures in quasi-static capacitance-, oltagc measurements are reported in this paper, and reasons for the generation of these curves are discussed.
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