本文采用电学测量法对刮膜式分子蒸馏过程中蒸发壁面上液膜的连续性和液膜厚度进行了实验测量。
Secondly, the electric measurement was adopted in this paper to study the liquid's film continuity and thickness on the evaporating wall of WFMD.
本文采用电学测量法对刮膜式分子蒸馏过程中蒸发壁面上液膜的连续性和液膜厚度进行了实验测量。
Secondly, the electric measurement was adopted in this paper to study the liquid's film continuity and thickness on the evaporating wall of WFMD.
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