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    To solve the problem of temperature drift, a new circuit with temperature compensation is designed and analyzed which enables APD to reach the optimal avalanche gain.

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    Zero drift and sensitivity temperature drift of the transducer are obviously decreased with the external circuits compensating.

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    Through the experiment with the circuits thermal drift, of TYZ-3 intelligent soil nutrition gauge, J-type field effect transistor(JFET) was found as the major cause of circuits thermal drift.

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  • 本文简要综述了国内外电路温度补偿方法,TYZ-3智能型土壤养分测试仪温度漂移进行试验研究

    Through the experiment with the circuits thermal drift, of TYZ-3 intelligent soil nutrition gauge, J-type field effect transistor(JFET) was found as the major cause of circuits thermal drift.

    youdao

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