由于蒙气差随着大气密度、温度和压力等条件的变化而变化，为降低蒙气差对光电测量设备测量精度的影响，提出了精密恒星回扫的新方法。
A new method of precise star back scanning for reducing the influence of atmosphere refraction on the measurement accuracy of optoelectronic instrument is presented.
由于蒙气差随着大气密度、温度和压力等条件的变化而变化，为降低蒙气差对光电测量设备测量精度的影响，提出了精密恒星回扫的新方法。
A new method of precise star back scanning for reducing the influence of atmosphere refraction on the measurement accuracy of optoelectronic instrument is presented.
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