金属迁移能导致混合微电路发生灾难性失效。
Metal Migration has been the cause of many catastrophic microcircuit failures.
主要阐述了混合微电路在军事及宇航电子装备中的技术优势及各种应用实例。
In this paper, the technical advantages of hybrid microcircuits in military and astronautic electronic apparatus and their various application examples are given.
主要阐述了混合微电路在军事及宇航电子装备中的技术优势及各种应用实例。
In this paper, the technical advantages of hybrid microcircuits in military and astronautic electronic apparatus and their various application examples are given.
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