利用深能级瞬态谱（DLTS）对电子辐照区熔硅中多稳态缺陷进行研究的结果表明。

The multistable defect in electron-irradiated Fz silicon has been studied by usingDLTS.

youdao

利用深能级瞬态谱（DLTS）对电子辐照区熔硅中多稳态缺陷进行研究的结果表明。

The multistable defect in electron-irradiated Fz silicon has been studied by usingDLTS.

youdao