本文设计了一款测试芯片并在一家半导体厂加工制造。
A test chip is designed and manufactured in a semiconductor foundry to test the layout dependency of the electroplating process.
测试芯片上的“系统”很多人已写了一个“片面系统”的概念，逻辑和模拟功能不断增长的集成在一个硅芯片或芯片。
Testing the "system on a chip" Much has been written about the concept of a "system on a chip," the ever-increasing integration of logic and analog functions on one silicon die or chip.
另外，本文还针对IP核投片测试提出一种扫描测试电路结构，能够实现测试芯片的扫描测试和高速内建自测试(BIST)。
Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.
其中一个问题是芯片太“过于智能”了——与普通芯片的数字脉冲输出不同，它的输出是模拟信号，因此用于数字芯片的测试程序被它干扰了。
Part of the problem is that the chip is just too intelligent - rather than a standard digital pulse it produces an analogue output that flummoxes the standard software used to test chips.
本周早先时候，世界最大的芯片制造商intel表示由于产品需求巨大降低，公司会裁员至少5000人，并且关闭旗下的测试和生产厂。
Earlier this week, Intel, the world's largest chip maker, said it would lay off at least 5, 000 people and close some test and manufacturing plants to deal with vanishing demand for its products.
提供针对在嵌入式或运行时目标中执行的软件的运行时分析和组件测试功能——从8位微芯片到64位运行时操作系统。
Provides runtime analysis and component testing capabilities for software executing on embedded or real-time targets — from 8-bit microchips to 64-bit real-time operating systems.
针对TSAT专用集成电路(ASIC)的测试，充分展示了微芯片在航空飞行中的功能、速度和匹配性。
Tests of the TSAT Application Specific Integrated Circuit (ASIC) demonstrated the microchip \ 's functionality, speed and suitability for spaceflight.
一枚叫做生物芯片的小型监测仪器通过镊子放入球员嘴里，芯片上涂有基因的变体，用以测试。
Swabs were taken from inside the players' mouths and the DNA placed on a small testing device called a biochip. This had been coated with the genetic mutations for which they were being tested.
测试结果表明，SAD芯片的实际工作性能良好，有效地解决了WPAN的实用性、高效性和可靠性问题。
The test results show that actual working performance of SAD chipset is good, and is achieves practicability, efficiency and dependability for WPAN.
探针卡，该探针卡的设计方法，以及使用该探针卡测试半导体芯片的方法。
Probe card, method of designing the probe card, and method of testing semiconductor chips using the probe card.
验证测试担负着检测芯片设计和检验测试程序正确性的双重任务，是芯片开发中不可或缺的重要环节。
The validation test has been a necessary and important process, which assumes the double task in checking the correctness of both the design and test programs.
对芯片管脚的测试可以提供100%的故障覆盖率，且能实现高精度的故障定位。
For testing chip pins, the fault coverage can reach 100%, and the fault position can be positioned with high accuracy.
失效分析是验证测试的重要方面，它为探求芯片失效机理与优化验证测试流程奠定了基础。
Failure analysis is a main aspect of the validation test and it provides the fundamental ways for tracing the failure mechanisms and optimizing the validation test flow.
该方法由于没有采用存储器存储测试模板，所以可以节省一定的芯片面积。
Because this method doesn't use memory to store the test patterns, it can save certain area of the chip.
本文就主流宽带PON技术、系统测试、芯片和设备进展进行简要介绍，最后对其应用予以展望。
This paper introduces the major broadband PON technologies, the test of PON system, and the progress of relevant chips and equipments, and finally gives an expectation of their applications.
可测试性设计是现代芯片设计中的关键环节，针对无线接入芯片的可测试性设计对测试技术有更高的要求。
Design for test is an important process in the chip design nowadays, testability design of wireless chip needs a much higher requirement of test technology.
这颗蓝牙射频调制解调芯片的实际测试数据也会被引用，以佐证和加深文章中的讨论。
Actual results from a Bluetooth radio modem chip will be used to further the discussion.
在阐述数字复解调原理的基础上实现了一个基于专用芯片的数字复解调测试系统。
By introducing the principle of digital IQ demodulation, we realizes a digital IQ demodulation system with the special large scale integration chip.
测试是芯片产品规模化生产的重要环节，其目标是检测制造工艺过程引起的电路故障。
Testing is an important process for industrial production of VLSI chips, the goal of which is to detect circuit faults caused by manufacturing process.
在系统芯片可测试性设计中考虑功耗优化问题是当前国际上新出现的研究领域。
Considering power optimization in design for testability of system-on-a-chip is a newly emerging research region.
实验结果表明，以“被测试电机-直流电力测功机-负载电阻”为结构、基于数字信号处理芯片的感应电动机转矩-转速特性自动测试系统是可行的。
The experimental results demonstrate: the automatic measurement system which bases on the DC dynamometer and DSP can well measure torque-speed characteristic of induction motor.
从可测性设计角度讨论了信息安全处理芯片的芯片级测试控制器的设计以及相应核的可测性设计。
The design of chip test controller of a security chip and design for test of corresponding cores are discussed in detail.
文中介绍JTAG边界扫描的概念、技术特点，以及在芯片功能测试、系统诊断、仿真、性能分析和导通测试方面的应用。
This paper focuses on the JTAG ideas and technical characteristics and summarizes the JTAG usage in chip function test, system diagnosis, simulation, performance analysis and conduction test.
通过建立SDH芯片验证平台和SDH芯片测试平台，实现IP软核的功能仿真、时序仿真和芯片性能测试。
With the establishing of verification and test platform for SDH chip, We realize the function simulation, timing simulation and performance test of the IP soft-core.
本文描述了使用共面微波探针的半导体芯片在片测试技术。
We present an on-wafer measurement technique of semiconductor wafer using special coplanar microwave probes.
研究了基于集成心跳探测芯片的心跳测试仪，介绍了其组成部分，即反射式红外传感器，单片机和LED显示器。
Studies heart rate testers based on integration heartbeat detection chip and introduces other components of the testers such as reflective infrared sensor, single-chip and LED display.
研究了基于集成心跳探测芯片的心跳测试仪，介绍了其组成部分，即反射式红外传感器，单片机和LED显示器。
Studies heart rate testers based on integration heartbeat detection chip and introduces other components of the testers such as reflective infrared sensor, single-chip and LED display.
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