那些传统的测试生成算法已不再适用。
Those traditional test generation algorithms are not applicable any more.
研究了组合电路中非鲁棒性路径时滞故障的测试生成算法。
The test generation algorithm for non-robust path delay fault in combinational circuits is studied.
然而，已有的电路并行测试生成算法并未取得理想的结果，尤其对时序电路。
However, the existing circuit parallel test generation algorithms fail get good results, especially for sequential circuit.
以组合电路的满足性测试生成算法为基础，提出了控制输入跟踪算法和测试衍生算法。
The paper proposes controlling input values tracing algorithm and test derivation algorithm based on test pattern generation using satisfiability.
另外本文还比较详细的分析比较了常用的存储器测试算法，简要分析了VLSI测试生成算法。
In addition, the detailed analysis of some frequently used memory test algorithms and brief analysis of some test generation algorithms for VLSI are also included in this paper.
针对数字电路中多故障测试生成效率较低的问题，提出了基于神经网络的数字电路多故障测试生成算法。
A multiple faults test generation algorithm based neural networks for digital circuits is proposed considering that the test generation efficiency for multiple faults in digital circuits is low.
提出了评价测试向量集及其生成算法的系统化方法，运用该方法对现有的并行测试生成算法进行了深入分析。
A new systematic method for evaluating interconnect testing algorithms is presented. Using this method, the parallel testing algorithms proposed in the literature are analyZed in detail.
针对数字电路路径时滞故障测试生成较难的问题，提出了基于神经网络的数字电路路径时滞故障测试生成算法。
A path delay fault testing generation algorithm for digital circuits based on neural network is proposed because the testing generation for path delay fault in digital circuits is more difficult.
本文提出了一种高效的时序电路测试生成算法，该算法是建立在自适应算法的基础上，并使用了十七值逻辑模型。
This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on self - adapting algorithm and USES a seventeen - valued logic model.
试验数据显示，该模型和测试生成算法不仅对生成测试序列是有效的，而且对于电路描述的可测性分析也有一定的帮助。
The results show that the circuit model and the test generation algorithm are not only effective for generating test sequence but also can help for the testability analyse.
本文还提出了一种面向最小相关度多捕获结构的测试向量生成算法。
A new test vector generation method for Multi-capture structure is presented to generate more efficient vectors.
结合一个实际电路，研究了一种可把数字电路故障定位到器件级的测试向量生成算法。
This paper studies a test vector generation algorithm for digital circuits which can locate the component faults.
最后还给出了实验中所用到的测试数据生成算法的设计与实现。
In the end, we present the design and implementation of algorithms in testing data generation.
基于上述检测模型，本文研究了基于虚拟测试话单自动生成算法。
Founded on the previous test model, the thesis researched the automatic generated algorithm based on virtual test telephone bill.
因此，LTS状态树生成算法是导出软件测试计划和测试用例研究工作中的关键问题。
Thus, LTS state tree generation algorithm is the key to deriving testing plans and testing cases from architecture descriptions.
提出了一种应用于软件测试中的基于模拟退火遗传算法的测试数据自动生成算法。
A kind of software test data automated generation method based on simulated annealing genetic algorithms is proposed.
在对嵌入式软件进行黑盒测试研究的基础上，提出了一种基于成对测试设计思想的测试用例生成算法。
Based on the research of black box testing of the embedded software, a new test case generation algorithm is proposed.
在对嵌入式软件进行黑盒测试研究的基础上，提出了一种基于成对测试设计思想的测试用例生成算法。
Based on the research of black box testing of the embedded software, a new test case generation algorithm is proposed.
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