本文还提出了一种面向最小相关度多捕获结构的测试向量生成算法。
A new test vector generation method for Multi-capture structure is presented to generate more efficient vectors.
结合一个实际电路，研究了一种可把数字电路故障定位到器件级的测试向量生成算法。
This paper studies a test vector generation algorithm for digital circuits which can locate the component faults.
兼容于BSDL和EDIF文件格式的自动测试向量生成软件可实现多种扫描测试功能。
The automatic testing software which is compatible with BSDL files and EDIF files can complete multiple boundary scan test tasks.
实验表明，对于输入端较多的电路，该方法生成的测试向量序列长度极大的减少，硬件开销也较小。
The experimental results show that for the circuits having many inputs, the length of test vectors generated by this method is much shorter and the hardware cost is smaller.
通过抽象，电路可以规范为行为集，并代替电路本身进行功能测试向量的生成。
Circuits described are modeled to behavior sets after abstraction, and can be replaced by their behavior sets during functional test vector generation procedures.
本文给出了一种新型的瞬态电流测试BIST测试生成器设计方案，该设计可以产生所需要的测试向量对，同时具有硬件开销小的优点。
This article gives a new BIST test generator design for transient current testing, this design not only produces needed test vector pairs but also has an advantage of low hardware overheads.
BIST控制器不仅可以执行传统的存储器测试算法，而且可以生成用于逻辑模块的测试向量。
The BIST controller can not only perform traditional memory test algorithms but also generates test patterns required for the logic part.
实验中分析了IC故障类型、一般故障诊断流程和进行扫描链本身完整性测试的方案，并提出了一种外加测试码向量生成的算法。
In the experiments, the fault type of IC test bus, the fault diagnosis flow and the test principles were analyzed, and a fault diagnosis strategy of test bus was proposed.
并使用时钟测试来减少生成测试向量所需的时间。
It can reduce the time used to generate the test vectors by using the clock test.
通过两级遍历，自动生成系统测试向量，并且达到所提的系统测试覆盖率的要求。
Through two levels traverse, generate test cases automatically and satisfy the coverage criteria stated in this paper.
针对数字系统仿真、故障诊断中对测试向量的特殊要求，利用VB 5 0开发出了拖拽鼠标快速生成测试向量的软件包。
To satisfy specialized demands of test vector in digital circuit simulation and fault diagnosis, we develop a software package"Dragging Mouse to Generate Test Vector"by VB5.0.
提出了评价测试向量集及其生成算法的系统化方法，运用该方法对现有的并行测试生成算法进行了深入分析。
A new systematic method for evaluating interconnect testing algorithms is presented. Using this method, the parallel testing algorithms proposed in the literature are analyZed in detail.
提出了评价测试向量集及其生成算法的系统化方法，运用该方法对现有的并行测试生成算法进行了深入分析。
A new systematic method for evaluating interconnect testing algorithms is presented. Using this method, the parallel testing algorithms proposed in the literature are analyZed in detail.
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