用X射线衍射法对表层残留奥氏体和残余应力作了定量分析。

The residual compressive stress and retained austenite were analyzed quantitatively by XRay Diffraction.

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用X射线衍射法对表层残留奥氏体和残余应力作了定量分析。

The residual compressive stress and retained austenite were analyzed quantitatively by XRay Diffraction.

youdao