研究了基于微电子测试的双桥结构图形，功能成品率模型参数提取的优化方法。
Then, based on the double bridge test structure, an optimization method is presented which is used to extracting the parameters of yield model fast and effectively.
通过分析MOS管在饱和区失配因素，优化MOS管失配模型，提出用最小二乘曲线拟合法进行相关模型参数提取。
The factors of MOS transistor in the saturation region are analyzed, the mismatch models are optimized, and the model parameter extraction is done by least squares curve fitting method.
介绍了一套砷化镓专用电路CAD软件，它可完成砷化镓器件模拟、器件模型参数提取、电路模拟、版图编辑、PG带生成的全过程设计。
The paper describes a CAD tool, it can perform GaAs device simulation, device parameter abstraction, circuit simulation, layout edition and PG tape generation.
介绍了一套砷化镓专用电路CAD软件，它可完成砷化镓器件模拟、器件模型参数提取、电路模拟、版图编辑、PG带生成的全过程设计。
The paper describes a CAD tool, it can perform GaAs device simulation, device parameter abstraction, circuit simulation, layout edition and PG tape generation.
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