介绍一种新型红外椭圆偏振光谱实验系统。
A new type of infrared spectroscopic ellipsometer has been designed and constructed.
对椭圆偏振光谱中的主角测量条件进行了分析。
The measuring condition for principle Angle in spectroscopic ellipsometry is analyzed.
研制成测量材料光学特性的红外椭圆偏振光谱仪，其测量波长范围为2。
A type of infrared spectroscopic ellipsometer was designed and constructed to study the optical properties of materials in the 2.
用椭圆偏振光谱法研究了热处理对射频辉光放电淀积的氢化非晶碳膜光学性质的影响。
Using spectroscopic ellipsometry, the influence of thermal annealing on optical properties of the plasma-deposited hydrogenated amorphous carbon films is investigated.
通过对新型椭圆偏振光谱仪MM-16原理和应用的研究，浅析MM-16的特点及优势。
By discussing about the theory and application of MM-16 Liquid Crystal Modulation Ellipsometer, we show the specialty and advantage of MM-16.
利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导（QSSPC）分析了氮化硅薄膜的特性。
The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.
利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导（QSSPC）分析了氮化硅薄膜的特性。
The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.
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