机内测试(BIT)技术是复杂电子系统的必需设备。
Built-in test (BIT) technique is a suit of necessary equipment of the complicated electronic system.
提出了一种脉冲多普勒雷达数字信号处理机机内测试方法。
A new method of built in self testing for pulse doppler radar digital signal processor was advanced.
介绍了嵌入式计算机应用于相控阵雷达机内测试设备的设计。
The design that embedded computer is applied to phased array radar for built in test equipment is introduced.
虚警率高是困扰机内测试（BIT）系统得到广泛应用的主要原因。
The high rate of false alarm is the main problem that influences the performance of builtin test (BIT) system and its wide application.
本文对光电经纬仪的小系统测试性采用了新的方法，即采用机内测试来完成。
In this paper, a new method for testability of Dimming and Focusing Autonomous System in Electro-optic Theodolite is introduced, that is BIT (Build-in test).
在分析机内测试(BIT)主要设计要素组成的基础上，提出了BIT综合表示模型。
A model for built-in test (BIT) integrated expression is presented based on the composition analysis of its main design elements.
首先采用双支持向量机（SVM）的方法将实时应力信息与机内测试诊断结果相互关联。
A support vector machine (SVM) model is used to correlate the false alarm of BIT to time stress information.
首先采用双支持向量机（SVM）的方法将实时应力信息与机内测试诊断结果相互关联。
A support vector machine (SVM) model is used to correlate the false alarm of BIT to time stress information.
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