给出了改进的曲面品质检查高亮线方法，用光片模型取代光柱模型，解决了现有高亮线方法存在的检查结果与基准光线相关的问题。
Firstly, by improving the existing light-cylinder model based highlight-line method for surface interrogation, a new method, named light-strip model based highlight-line method, is proposed.
给出了改进的曲面品质检查高亮线方法，用光片模型取代光柱模型，解决了现有高亮线方法存在的检查结果与基准光线相关的问题。
Firstly, by improving the existing light-cylinder model based highlight-line method for surface interrogation, a new method, named light-strip model based highlight-line method, is proposed.
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