在激光等离子体实验中，用晶体谱仪可获得高温等离子体所发射的X光谱。
X-ray spectral lines emitted by high temperature plasma can be taken by means of crystal spectrograph in laser-plasma experiments.
实验中采用晶体谱仪时间积分和X射线条纹相机同时获取碳氢平面靶强激光烧穿厚度和烧穿时间。
The ablation thickness and time were synchronously measured with time integrated X ray crystal spectrometers and a X ray streak camera.
研究了谱仪的理论分辨率，它主要取决于晶体本身的分辨率，随布拉格角增大而提高。
The theoretical resolution is analyzed, it is mostly decided by the crystal resolving power, and it can be raised with the Bragg angle accretion.
详细介绍了快速高压晶体管开关在加速器束流脉冲化和用于二次离子测量的加速器飞行时间谱仪上的应用。
The application of Fast High Voltage Transistor Switches (HTS) in pulsed ion beam and the time of flight (TOF) setup is described.
研究了纳米晶体铜材料的压制工艺条件对其相对密度和显微硬度的影响，并用正电子湮没寿命谱、扫描电镜和热重分析仪对其微观结构进行了表征。
The influence of relative density and microhardness on pressing parameter of nanocrystalline Cu was studied, and its microstructure was characterized by PAS, SEM and TG.
X射线衍射仪、电子能谱仪、原子力显微镜和椭圆偏振仪等研究薄膜的击穿电压、介电常数、晶体结构、化学成分、表面形貌及薄膜的折射率。
The breakdown voltage, permittivity, crystal structure, composition, surface and refractive index of the thin films were studied by I-V, C-V, XRD, EDS, AFM and elliptical polarization instrument.
X射线衍射仪、电子能谱仪、原子力显微镜和椭圆偏振仪等研究薄膜的击穿电压、介电常数、晶体结构、化学成分、表面形貌及薄膜的折射率。
The breakdown voltage, permittivity, crystal structure, composition, surface and refractive index of the thin films were studied by I-V, C-V, XRD, EDS, AFM and elliptical polarization instrument.
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