模拟试验数据分析结果表明，该试验方法可以有效地提高晶体管稳态工作寿命试验方法的可信度。
Analyzing result of simulated experiment data shows that the test method can increase availably the accuracy of the transistor steady-state operation life test method.
为了在试验周期中了解晶体管的结温，提出一种在功率晶体管稳态工作寿命试验过程中结温的测量与控制方法。
A method for measuring and controlling the junction temperature of power transistor during succession operation life test is proposed.
本文介绍了应用电荷抽取效应测量MOS晶体管中少子复合寿命的方法。
A method is presented for measuring the minority recombination Lifetime in MOS fet's by charge pumping effect.
本文介绍了应用电荷抽取效应测量MOS晶体管中少子复合寿命的方法。
A method is presented for measuring the minority recombination Lifetime in MOS fet's by charge pumping effect.
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