研究了图像复原处理在显微测量中的应用。
Application of image reconstruction in microscopic measurement is studied.
显微测量表明，药剂处理后的菌丝分枝间距多数明显缩短，如骠马、啶虫脒、高效氯氰菊酯等；
Microscopic measurment indicated that the intervals of mycelia branches were shortened significantly when treated with fenoxaprop, cyflithrin, deilamethrin and so on.
用显微测量粒径分析法 ，测量出各种类的粒径参数 ，可以较准确地推算出浮游植物群落粒级结构。
This indicates that when we study the size fractions of phytoplankton, it is necessary to mend it by microscopical sizing method.
方法：胚胎大鼠脊髓神经细胞原代培养，倒置相差显微镜下进行细胞记数和显微测量，观察神经元存活和生长分化的状况。
Methods: Using primary nerve cell culture, we observed the survival and growth of spinal cord neurons with phase-contract microscope.
数字全息显微测量技术是检测显微样本微观结构的重要手段，具有系统简单、非入侵、动态性好等特点，是一种很好地具有应用前景的技术。
The digital micro-holography is a important means to measure microstructure of samples, and it is a technology with characteristics of simpleness, non-contact and dynamic, and so on.
透射电子显微镜呈像的方法是对物体发射万亿电子，测量它们的吸收，偏斜和能量损失。
Transmission electron microscopy creates images by shooting trillions of electrons through an object and measuring their absorption, deflection and energy loss.
研究者使用装备有精密测量激光的显微镜来观察每个稀薄的大脑组织晶片。
Researchers view each hair-thin wafer of brain tissue under a microscope outfitted with a laser for precision dissection.
不过，这种显微镜已经能够测量1.2微米的物体，相比较红细胞典型在6至8微米左右。
Nevertheless, the microscope can pick out objects just 1.2 micrometers across – red blood cells are typically 6 to 8 micrometers across.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
用扫描电子显微镜观察和测量腐蚀后硅样品的亚表面裂纹。
The depth of cracks on the silicon sample subsurface corroded was measured by a scanning electron microscope.
用计算机图像分析系统测量脐带静脉的几何形态及显微结构成分的含量。
The geometrical morphology data and the relative contents of microstructure of umbilical cord vein were measured by the computer image analysis system.
基于这一原理，我们研究了一种使用扫描显微镜和微计算机测量光学传递函数的方法。
Based on this principle, a method is described in this paper of measuring OTF of an optical system by means of scanning photometric microscope eyepices.
用原子力显微镜作为测量工具，获取表面形貌数据。
And the surface texture data by atomic force microscope (AFM) are obtained.
前言：对用电子显微镜测量薄膜厚度的三种方法：双束衍射法、污斑法、污线法进行了实验及比较分析。
The experiments , comparison and analysis for the three thickness measurement methods :two-beam diffraction method , contamination spot method and contamination line method were carried out.
测量中，把扫描隧道显微镜的探针扫描线作为参考栅，把物质原子晶格栅结构作为试件栅，对这两组栅线干涉形成的云纹进行了纳米级变形测量。
In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating.
并给出了对两个显微物镜测量的结果。
Measuring results of two microscope objectives were also given.
采用显微图像测量薄膜包衣厚度。
Micrograph technology was used to measure film coating thickness.
本文以实验为基础，提出在工具显微镜类仪器中，为了提高测量精度，应如何正确使用光（门东）。
On the basis of experiment, this paper proposes how diaphragms are used correctly with tooling microscope line equipment to improve measuring precision.
血管口径用手术显微镜的目镜标尺测量，血管长度和分布范围用直尺和分规测量。
Vascular caliber with operating microscope eyepiece scale of measurement, the length and distribution of blood vessels using a ruler and measurement of sub-regulation.
光镜观察后，用计算机图像分析系统测量其中膜显微结构成分的相对含量。
The microstructure component in tunica media of umbilical cord vein were measured by the computer image analysis system.
为了解决现有坐标测量机中的单目显微视觉测头视场小和景深小的缺点，提出了显微视觉测头的动态测量方法。
A dynamic measurement technology is designed in order to dispose of imperfection that is small field of view and small depth of field of monocular micro-vision probe.
阐述了光切显微镜测量表面粗糙度的原理以及如何利用该原理测量小尺寸复杂刀具角度的方法。
The theory of measuring surface roughness by using light-section microscope is described, and a simple method to measure the Angle of complicated small-scale tool is introduced.
图像质量是影响光学显微系统微小尺寸测量精度的一个重要原因。
Image quality has an important effect on the micro structure measurement accuracy of optical microscopic systems.
原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。
Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.
用透射电子显微镜(TEM)测量了银纳米微粒的平均粒径。
The mean diameters of sliver nanoparticle are measured by transmission electron microscopy (TEM).
用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。
Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.
研究了加载负荷、试样表面粗糙度及测量偏差修正对航空用贵金属（合金）丝材和薄片显微硬度测量的影响。
The effect of load specimen surface roughness and test deviation amendment on microhardness of aeronautical noble metal (alloy) wires and sheets was studied in this paper.
研究了加载负荷、试样表面粗糙度及测量偏差修正对航空用贵金属（合金）丝材和薄片显微硬度测量的影响。
The effect of load specimen surface roughness and test deviation amendment on microhardness of aeronautical noble metal (alloy) wires and sheets was studied in this paper.
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