1969年，一款可以自动检测显微样品光度的扫描显微光度仪问世。
A scanning microscope photometer for the automatic photometry of microscopic specimens follows in1969.
这幅显微照片是通过扫描穿过样品的电子束而获得的，同时检测器对从样品表面反弹的电子进行追踪，这些电子显示了标本的外形。
This photomicrograph was obtained by scanning a beam of electrons across the sample while a detector kept track of electrons bouncing off its surface, betraying the specimen's outer shape.
挖掘到的土壤层将用一个化学装置来进行检测，装置中带有显微镜，电化学和传导性的检测器，其中带有大量的水，因此其将不能检测样品中是否含有水。
The regolith was analysed by a chemistry set known as the Microscopy, Electrochemistry and Conductivity Analyser, which contains so much water itself that it cannot detect the stuff in samples.
后续的挖掘重点在于为显微镜和湿性化学实验室提供样品。
Later digs will focus on bringing samples to its microscope and wet chemistry lab.
通过电子显微镜，他对样品的表征进行了观察。
With a microscope, he observed the surface characteristics of the sample.
整个过程并不复杂。他把显微镜载片放在他的窗台上，收集10个小时后的落灰样品。
The process is not complicated: he puts microscope slides on his windowsill and collects the samples covered by fallen dust after 10 hours.
用扫描电子显微镜观察和测量腐蚀后硅样品的亚表面裂纹。
The depth of cracks on the silicon sample subsurface corroded was measured by a scanning electron microscope.
结果：显微鉴别、薄层色谱鉴别可检出样品中相应的显微特征及薄层斑点。
Results: the corresponding microscopical characteristics and thin layer spots from the samples can be obtained.
结果表明：利用扫描电子声显微镜技术在不对样品表面进行任何处理的情况下，可以直接对电畴结构进行观察。
The results show that the SEAM technique can be used directly to observe the domain structure of ferroelectric ceramics and single crystal materials without any treatment for test samples.
透射电镜(TEM)分析技术是揭示材料宏观性能与其显微结构之间的内在关联性的重要手段，但样品制备难度较高。
TEM analysis technique plays an important role in revealing the relationship between the macroscopic properties and the micro-structure of materials, but its samples preparation is difficult.
该技术主要包括：目的基因和靶细胞的制备、样品的灌注以及对细胞的显微注射。
The main procedures were: to prepare the target genes and cells, to fill the sample into the glass capillary injector and to proceed microinjection.
一种显微镜，它利用传递光过程中的区别，或通过样品反射形成相不同，与样品不同部分的影像进行对比。
A microscope that USES the differences in the phase of light transmitted or reflected by a specimen to form distinct, contrasting images of different parts of the specimen.
体视显微镜具有工作空间大、实时性高以及不损坏样品表面等优点，己用于微观对象三维立体信息的测量。
Stereo light microscope which possesses relatively large depth of field, good performance in real-time and no breaking surface of sample, is used in stereo three-dimensional information measurement.
扫描离子电导显微镜技术是在纳米尺度进行非导电的生物样品成像的一种新型扫描探针显微镜技术。
As a new kind of scanning probe microscopy, scanning ion conductance microscopy (SICM) is designed for imaging non-conducting biological sample at the nanometer scale.
描述了一种用于检测样品表面电荷分布的静电力显微镜(EFM)。
An Electrostatic Force Microscope (EFM) for testing surface charge distribution of a sample is described.
对生物样品的研究，软x射线显微术具有独特的优势。
Soft X-ray microscopy has unique advantages in the study of biological specimens.
用显微镜对样品的孔隙结构进行了观察，并对样品的力学性能与胶粉粒径的变化规律进行了研究。
The cell structure of the samples was observed and the changing regularity of mechanical properties with the rubber powder diameter was studied.
用透射电子显微镜（TEM）分析了所制备的样品。
The samples have been analyzed with transmission electron microscope(TEM).
1920年，比较目镜问世。此项技术使得可以同时观察到来自两台显微镜的样品。
In 1920, the comparison eyepiece is introduced, which allows simultaneous observation of two specimens under two microscopes.
光子扫描隧道显微镜的研制与样品显微成像技术。
The development of photon scanning tunneling microscopy and the microscopical imaging technology of samples.
在电解抛光过程中用透射和反射光作显微镜观察，借以监视抛光样品，使获得最佳抛光条件。
The transmitting and reflecting optical microscopy has been used in the electrolytic polishing process for monitoring the polished specimen to obtain the optimum polishing condition.
推导了模拟多层样品显微成像的数学模型，给出了用程序框图表示的基本仿真系统骨架。
The mathematical model used to microscopically image multi layered tissues is presented. The basic skeleton of the simulation program is demonstrated with flow chart.
介绍一种用于无损检测的软x射线电视显微镜，并给出了用该设备检测几种不同类型样品的结果。
A soft X-ray TV microscope for nondestructive testing has been developed. The testing results of some samples with the system are given.
用扫描电子显微镜(SEM)对粉料及微波合成的块体样品表面进行物相分析和元素的半定量分析。
Scaning electronics microscopy (SEM) was applied hereby to surface phase and elements analysis of the powder by precursor method and grain sample by microwave method.
例如，它能够对较厚的活性含水的生物样品直接进行显微成像以及元素分布的微区分析等。
It can provide micrographs of living hydrated thick samples and their elemental distribution with high resolution.
表面显微硬度较未处理的样品明显提高。
The surface microhardness was substantially increased compared with the untreated.
此外，采用不同方法制备了多孔硅样品，分析了其表面形貌并用显微拉曼光谱法测定了导热系数。
Furthermore, different porous silicon samples were prepared, and whose surface morpho - (logy) analysis and thermal conductivity measurement using micro-raman technology were performed.
扩散偶和合金样品采用光学显微镜、扫描电镜和电子探针显微分析技术进行分析。
Both the diffusion couple specimens and the alloys were examined by means of optical microscopy, scanning electron microscopy, and electron probe microanalysis.
扩散偶和合金样品采用光学显微镜、扫描电镜和电子探针显微分析技术进行分析。
Both the diffusion couple specimens and the alloys were examined by means of optical microscopy, scanning electron microscopy, and electron probe microanalysis.
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