本文还研究了不同的PANI含量对薄膜透过率和方块电阻的影响。
Otherwise, the effect of different PANI content on the properties of hybrid films was studied.
但多晶硅电阻有较低的温度系数和低的方块电阻，应根据需要来选择电阻。
But the poly resistance has got lower temperature coefficient and lower Sheet resistance than well resistance So we choose the resistance type depending upon the requirements.
随着PANI含量的增加，薄膜的可见光透过率逐渐下降，方块电阻也降低。
The sheet resistance of films decreased with an increase of PANI content, while visible light transmittance of the hybrid films also declined.
讨论了超薄金属膜结构中泡沫厚度对吸收峰位的影响，及金属薄膜的方块电阻对吸收峰值的影响。
It is concluded that the structure of ultra-thin metallic films can result in resonance absorbing, the absorbing performances were decided by both medium materials and metallic films.
因此，在半导体行业中，必须快速、准确地对硅晶圆片导电类型、方块电阻和电阻率进行判断、测量和分档。
Therefore, in the semiconductor industry, we must quickly and accurately type conductive film on silicon wafers, the square resistance and resistivity of judgement, measurement, and grading.
针对手提式薄膜方块电阻测试仪在使用中容易出现的问题，进行分析研究，提出了解决方案，并在实验中得到实现。
Analyzing the problems which often happen in the portable square resistance meter for the thin films on ITO glass surface, some solutions were proposed and carried out by tests.
利用X射线衍射和能量散射X射线能谱表征方法，并结合薄膜方块电阻的测定，探讨了热处理方式和热处理温度对薄膜化学组成及薄膜电阻的影响。
Then, the effects of heat treatment and temperature on the chemical composition and sheet resistance of the prepared films were investigated by XRD, EDXS and sheet resistance measurements.
利用X射线衍射和能量散射X射线能谱表征方法，并结合薄膜方块电阻的测定，探讨了热处理方式和热处理温度对薄膜化学组成及薄膜电阻的影响。
Then, the effects of heat treatment and temperature on the chemical composition and sheet resistance of the prepared films were investigated by XRD, EDXS and sheet resistance measurements.
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