数字集成电路测试内容包括逻辑功能测试、直流参数测试和交流参数测试。
Digital IC test content includes logic functional test, test of DC parameters and test of AC parameters.
本文介绍了一种以MCS—51单片机为基础的TTL数字电路逻辑功能测试仪。
A new tester for the function of TTL digital circuit based on MCS-51 single chip computer is described.
为解决数字电路插板的测试问题，设计了80路逻辑信号发生器。
To settle the problem of testing logic card, we have designed an 80 channels logic generator.
本发明的数字逻辑芯片及其可测试设计的方法，能够通过少量管脚实现电路在扫描测试时的可观测。
The digital logic chip of the invention and the method of design for testing can realize the observation of circuit scanning test by adopting few pins.
测试系统中采用了以数字信号处理器为核心，以复杂可编程逻辑器件为外围电路，来控制执行部件和测试与接收由外部返回的数字信号、模拟信号和开关信号。
Testing system, in which DSP is the part of core and CPLD is as peripheral circuit, controls operation parts, and test or incept the digital signal, analog signals and switch signals from exterior.
在对光纤陀螺信号检测理论分析的基础上，设计了模拟解调电路、数字逻辑电路等，并进行了样机测试。
Based on the analysis to signal detection theory of FOG, the analog demodulation circuit and digital logic circuit etc were designed, and prototype test was carried out.
在对光纤陀螺信号检测理论分析的基础上，设计了模拟解调电路、数字逻辑电路等，并进行了样机测试。
Based on the analysis to signal detection theory of FOG, the analog demodulation circuit and digital logic circuit etc were designed, and prototype test was carried out.
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