文章分析了1149.4和1149.1标准的测试访问端口，以及测试逻辑结构和测试协议的异同，提出了模拟边界 扫描单元ABM和数字边界 扫描单元DBM的行为模型；

The test access port and test logic architecture and protocol of 1149.4 and 1149.1 standards are analyzed, and behavior models for ABM and DBM are put forward.

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本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。

This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…

youdao

本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。

This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…

youdao