并提供了自制四探针测量仪的方法。
模型中的气流速度用五孔球形探针测量。
The gas flow velocities were measured in terms of a five hole spherical probe.
多功能探针测量按钮触发。
用静电悬浮双探针测量了电子温度和离子温度。
The electron temperature and ion density were measured by a floating double-probe.
本文探索了用朗谬尔探针测量火焰电子温度的方法。
The measurements for the electron temperature of flame using the Langmuir probe are explored.
四探针测量金属薄膜电阻率是当今微电子技术领域中常用的方法。
A measurement of resistivity of metal film using four-point probe technique can be used as the general physics experiment.
本文给出了发射探针和电容探针测量等离子体电位的实验和方法。
Experiments and methods for measuring plasma potential with emissive probe and capacity probe are described.
开发了一套新型的三探头单纤光导探针测量系统，用于测量二维气泡速度。
An advanced measuring system with tri fiber optical probe has been developed to measure two dimensional bubble velocity.
其中两个探针提供恒定的电流，而另外两个探针测量一部分样品上的电压降。
While two contacts supply a constant current, the other two contacts measure the voltage drop across a portion of the sample.
在不同位置采用五孔探针测量了两种叶栅的气动参数并在叶片表面做了墨迹流动显示。
Aerodynamic parameters of the two cascades are measured by a five-hole probe at different positions and ink trace flow visualization is conducted on blade surfaces.
本文用激光探针测量了砷离子注入硅在CW CO_2激光退火过程中的实时分辨反射率。
The time-resolved optical reflectivity of as ion-implanted silicon during CW CO_2 laser annealing has been measured by using laser probes.
通过壁面静压测量、流场显示及气动探针测量研究了不同掠型叶片组成的平面扩压叶栅特性。
The performance of rectangular compressor cascades composed of different swept blades was studied by static pressure measurement, flow visualization and probe measurement.
测量的结果表明，利用单探针测量的主等离子体边缘参数与朗缪尔四探针测量结果基本一致。
The results obtained show that radial profiles of the temperature and the density measured with the single probe are in agreement to those with a four-probe system.
应用双头电导探针测量系统，对垂直上升管内油水两相分散流局部相分布特性进行了系统测量。
The local phase distribution characteristics of oil and water two-phase flow through a vertical upward pipe are studied experimentally using a double-sensor conductivity probe.
计算获得的偏滤器内外靶板上打击点出现和消失的时间与布置在偏滤器靶板上静电探针测量到的信号很好地符合。
The time of the appearance and disappearance of the strike point at the target is in agreement with the signals measured by the static electric probes.
使用自行设计、制作的电导探针测量系统，测量了水平管内瞬时、局部空隙率，并且得到流型转变的特征密度概率图谱。
The conductivity probe was used to measure the instantaneous local void fraction in the horizontal pipe and the illustrative picture of probability density of flow pattern translation is obtained.
本文描述了用静电探针测量探针悬浮电位的方法，给出MM-4中电位分布的实验结果。结果表明轴向电位分布不对称，径向分布对称；
Some experimental results of the potential distribution in MM-4 fusion device are presented by measuring the floating potential of probe.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
如有必要，延长百分表的探针，直到可以明确测量活塞顶为止。
If necessary extend the probe of the dial gauge until you can definitely take measurements on the piston crown.
图4 -47是四点同线探针用于电阻率测量的配置图。
Figure 4-47 is a diagram of four - point collinear probe setup for resistivity measurements.
图4 -47是四点同线探针用于电阻率测量的配置图。
Figure 4-47 is a diagram of four-point collinear probe setup for resistivity measurements.
如果你尝试在其中特定z值平面内用一个2维测头测量一个3d立体圆锥体。那么探针直径将会影响精度。
If you're trying to check a 3d cone as a 2d dia at a certain Z level then, yes probe diameter will affect accuracy.
电流从两个外部的探针加入，而电压降则在两个内部的探针之间测量。
The current is sourced through the two outer probes and the voltage drop is measured between the two inner probes.
用金属探针法测量塔板上气液两相流中某些点的含气率。
A method of using metal probe for measuring the void fraction at any point in gas-liquid two-phase flow on Sieve tray is described.
最后，通过数值模拟预测了在该旋转盘试验中是可以用五孔探针对流场进行测量的。
Finally measurement of the flow field in the rotating disk with a five-hole probe is demonstrated feasible by the numerical simulation.
由于探针可以采取冷却措施，因而可以测量很高的温度。
As the probe is cooled, the measurements for high flame temperature can be achieved.
摩尔偏析测量术通过测量探针光束经过不均匀介质后光线的偏折来估算介质的折射率。
Moire deflection measurement can be used to calculate refractive index by measuring deflection of probe beam passing through mediums.
单管式扫描器的结构误差是影响扫描探针显微镜测量精度的主要误差因素之一。
Tube scanner′s structure errors have great effect on the measurement accuracy of Scanning Probe Microscope(SPM).
单管式扫描器的结构误差是影响扫描探针显微镜测量精度的主要误差因素之一。
Tube scanner′s structure errors have great effect on the measurement accuracy of Scanning Probe Microscope(SPM).
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