用拉曼光谱、SEM和UV分光光度计对不同沉积温度下沉积的薄膜的结构特性进行分析。
Raman scattering, SEM and UV spectrophotometer are used to analyse the structure changes of microcrystalline silicon films throughout the deposition temperature range.
用分光光度计和激光拉曼光谱仪分别测定了样品的可见光透过率和发光强度。
Spectrophotometer and Laser Roman Spectrometer have been used for determining the intensity of transmission and emission.
用分光光度计和激光拉曼光谱仪分别测定了样品的可见光透过率和发光强度。
Spectrophotometer and Laser Roman Spectrometer have been used for determining the intensity of transmission and emission.
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