本文提出一种可同时计算长波长和短波长折射静校正量的新方法。
The paper presented a new method for refraction statics which can simultaneously calculate long wavelength and short wavelength.
本文提出一种可同时计算长波长和短波长折射静校正量的新方法。
The paper presented a new method for refraction statics which can simultaneously calculate long wavelength and short wavelength.
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