单粒子效应是卫星抗辐射加固研究的主要对象之一。
The single event effect (SEE) is an object of study of radiation hardening of satellite.
着重研究倒掺杂结构PDSOI器件较常规PD SOI 器件抗SEU能力的改善，并对SOI器件单粒子辐射的电荷收集效应进行了模拟与仿真。
The improvement of retrograde structure PD SOI to SEU versus conventional PD SOI is intensively studied in the end, and the charge collection effects of SEE in SOI device are also simulated.
着重研究倒掺杂结构PDSOI器件较常规PD SOI 器件抗SEU能力的改善，并对SOI器件单粒子辐射的电荷收集效应进行了模拟与仿真。
The improvement of retrograde structure PD SOI to SEU versus conventional PD SOI is intensively studied in the end, and the charge collection effects of SEE in SOI device are also simulated.
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