光子扫描隧道显微镜的研制与样品显微成像技术。
The development of photon scanning tunneling microscopy and the microscopical imaging technology of samples.
通过隧道扫描显微镜（STM）、紫外吸收光谱、荧光光谱等测试技术对所得的样品进行表征。
Obtained samples were characterized by means of Scanning Tunneling(Microscopy)(STM), UV-Vis, and PL emission.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
应用推荐