结果表明:利用扫描电子声显微镜技术在不对样品表面进行任何处理的情况下,可以直接对电畴结构进行观察。
The results show that the SEAM technique can be used directly to observe the domain structure of ferroelectric ceramics and single crystal materials without any treatment for test samples.
结果表明:利用扫描电子声显微镜技术在不对样品表面进行任何处理的情况下,可以直接对电畴结构进行观察。
The results show that the SEAM technique can be used directly to observe the domain structure of ferroelectric ceramics and single crystal materials without any treatment for test samples.
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